Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp | 2010-01-01 00:00:00 | Springer | 255 | Electrical Engineering
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
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